| 2008 |
|---|
| 30 | EE | Olivier Barais,
Jacques Klein,
Benoit Baudry,
Andrew Jackson,
Siobhán Clarke:
Composing Multi-view Aspect Models.
ICCBSS 2008: 43-52 |
| 29 | EE | Yves Le Traon,
Tejeddine Mouelhi,
Alexander Pretschner,
Benoit Baudry:
Test-Driven Assessment of Access Control in Legacy Applications.
ICST 2008: 238-247 |
| 28 | EE | Sagar Sen,
Benoit Baudry,
Jean-Marie Mottu:
On Combining Multi-formalism Knowledge to Select Models for Model Transformation Testing.
ICST 2008: 328-337 |
| 27 | EE | Freddy Munoz,
Benoit Baudry,
Olivier Barais:
A classification of invasive patterns in AOP
CoRR abs/0804.1696: (2008) |
| 2007 |
|---|
| 26 | EE | Robert B. France,
Franck Fleurey,
Raghu Reddy,
Benoit Baudry,
Sudipto Ghosh:
Providing Support for Model Composition in Metamodels.
EDOC 2007: 253-266 |
| 25 | EE | Erwan Brottier,
Benoit Baudry,
Yves Le Traon,
David Touzet,
Bertrand Nicolas:
Producing a Global Requirement Model from Multiple Requirement Specifications.
EDOC 2007: 390-404 |
| 24 | EE | Benoit Baudry,
Clémentine Nebut,
Yves Le Traon:
Model-Driven Engineering for Requirements Analysis.
EDOC 2007: 459-466 |
| 23 | EE | Franck Fleurey,
Erwan Breton,
Benoit Baudry,
Alain Nicolas,
Jean-Marc Jézéquel:
Model-Driven Engineering for Software Migration in a Large Industrial Context.
MoDELS 2007: 482-497 |
| 2006 |
|---|
| 22 | EE | Jean-Marie Mottu,
Benoit Baudry,
Yves Le Traon:
Mutation Analysis Testing for Model Transformations.
ECMDA-FA 2006: 376-390 |
| 21 | EE | Benoit Baudry,
Franck Fleurey,
Yves Le Traon:
Improving test suites for efficient fault localization.
ICSE 2006: 82-91 |
| 20 | EE | Erwan Brottier,
Franck Fleurey,
Jim Steel,
Benoit Baudry,
Yves Le Traon:
Metamodel-based Test Generation for Model Transformations: an Algorithm and a Tool.
ISSRE 2006: 85-94 |
| 19 | | Yves Le Traon,
Benoit Baudry:
Test d'intégration d'un système à objets - planification de l'ordre d'intégration.
LMO 2006: 217-230 |
| 18 | EE | Jean-Marie Mottu,
Benoit Baudry,
Yves Le Traon:
Reusable MDA Components: A Testing-for-Trust Approach.
MoDELS 2006: 589-603 |
| 17 | EE | Benoit Baudry,
David Hearnden,
Nicolas Rapin,
Jörn Guy Süß:
Report on the 3rd MoDeVa Workshop - Model Design and Validation.
MoDELS Workshops 2006: 179-181 |
| 16 | EE | Yves Le Traon,
Benoit Baudry,
Jean-Marc Jézéquel:
Design by Contract to Improve Software Vigilance.
IEEE Trans. Software Eng. 32(8): 571-586 (2006) |
| 2005 |
|---|
| 15 | EE | Benoit Baudry,
Christophe Gaston,
Sudipto Ghosh:
Report on the 2nd Workshop on Model Development and Validation - MoDeVa.
MoDELS Satellite Events 2005: 32-38 |
| 14 | EE | Benoit Baudry,
Franck Fleurey,
Jean-Marc Jézéquel,
Yves Le Traon:
Automatic Test Case Optimization: A Bacteriologic Algorithm.
IEEE Software 22(2): 76-82 (2005) |
| 13 | EE | Benoit Baudry,
Yves Le Traon:
Measuring design testability of a UML class diagram.
Information & Software Technology 47(13): 859-879 (2005) |
| 12 | EE | Benoit Baudry,
Franck Fleurey,
Jean-Marc Jézéquel,
Yves Le Traon:
From genetic to bacteriological algorithms for mutation-based testing.
Softw. Test., Verif. Reliab. 15(2): 73-96 (2005) |
| 2004 |
|---|
| 11 | EE | Franck Fleurey,
Yves Le Traon,
Benoit Baudry:
From Testing to Diagnosis: An Automated Approach.
ASE 2004: 306-309 |
| 10 | EE | Sébastien Gérard,
Chokri Mraidha,
François Terrier,
Benoit Baudry:
A UML-Based Concept for High Concurrency: The Real-Time Object.
ISORC 2004: 64-67 |
| 2003 |
|---|
| 9 | EE | Benoit Baudry,
Yves Le Traon,
Gerson Sunyé,
Jean-Marc Jézéquel:
Measuring and Improving Design Patterns Testability.
IEEE METRICS 2003: 50- |
| 8 | EE | Yves Le Traon,
Farid Ouabdesselam,
Chantal Robach,
Benoit Baudry:
From diagnosis to diagnosability: axiomatization, measurement and application.
Journal of Systems and Software 65(1): 31-50 (2003) |
| 2002 |
|---|
| 7 | EE | Benoit Baudry,
Franck Fleurey,
Jean-Marc Jézéquel,
Yves Le Traon:
Automatic Test Cases Optimization Using a Bacteriological Adaptation Model: Application to .NET Component.
ASE 2002: 253-256 |
| 6 | EE | Benoit Baudry,
Yves Le Traon,
Gerson Sunyé:
Testability Analysis of a UML Class Diagram.
IEEE METRICS 2002: 54- |
| 5 | EE | Benoit Baudry,
Franck Fleurey,
Jean-Marc Jézéquel,
Yves Le Traon:
Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment.
ISSRE 2002: 195-206 |
| 2001 |
|---|
| 4 | EE | Benoit Baudry,
Yves Le Traon,
Jean-Marc Jézéquel:
Robustness and Diagnosability of OO Systems Designed by Contracts.
IEEE METRICS 2001: 272-284 |
| 3 | EE | Benoit Baudry,
Yves Le Sunyé,
Jean-Marc Jézéquel:
Towards a 'Safe' Use of Design Patterns to Improve OO Software Testability.
ISSRE 2001: 324-331 |
| 2000 |
|---|
| 2 | EE | Benoit Baudry,
Vu Le Hanh,
Jean-Marc Jézéquel,
Yves Le Traon:
Building Trust into OO Components Using a Genetic Analogy.
ISSRE 2000: 4-14 |
| 1 | EE | Benoit Baudry,
Vu Le Hanh,
Yves Le Traon:
Testing-for-Trust: The Genetic Selection Model Applied to Component Qualification.
TOOLS (33) 2000: 108-119 |
